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DBaFe2As2.jpg

Superlattice of SrTiO and BaFe2As2

Digitally enhanced HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.
Image by Shuyi Zhang from the Pan Research Group.

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Superlattice of SrTiO and BaFe2As2

Digitally enhanced HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.
Image by Shuyi Zhang from the Pan Research Group.

Welcome to EMAL!

The University of Michigan Electron Microbeam Analysis Laboratory (EMAL) is a university-wide user facility for the microstructural and microchemical characterization of materials. Being a user facility, EMAL is open to anyone in the University research community. The laboratory is also open to users from other universities and to users from local industry.

It is located at the Space Research Building on the U of M North Campus and the C.C. Little Science Building on the U of M Central Campus.


FEI Helios NanoLab

New Instrument Available

With the generous support of the College of Engineering, EMAL has acquired a new focussed ion beam workstation, an FEI Helios NanoLab 650. Please check out the new system's web page. Please note that his instrument is a state-ofthe-art system and its use will be used for ultra-high resolution SEM, 3D XEDS and EBSD and high resolution lift out samples. Requests to use it for routine SEM will not be considered. For further information please contact John Mansfield (jfmjfm@umich.edu or (734) 936-3352), Kai Sun (kaisun@umich.edu or (734) 936-3353) or Haiping Sun (haipings@umich.edu or (734) 936-3338).

Note. If you do not find the technique you wish to use listed on our pages, please check our Other Links page for other UM facilities. If that fails, contact John Mansfield (jfmjfm@umich.edu or (734) 936-3352) and he may be able to direct you to an alternate resource.

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