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Al Map on Semiconductor Chip

An X-ray energy dispersive spectormetry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield.

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Al Map on Semiconductor Chip

An X-ray energy dispersive spectormetry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield.

Welcome to EMAL!

The University of Michigan Electron Microbeam Analysis Laboratory (EMAL) is a university-wide user facility for the microstructural and microchemical characterization of materials. Being a user facility, EMAL is open to anyone in the University research community. The laboratory is also open to users from other universities and to users from local industry.

It is located at the Space Research Building on the U of M North Campus and the C.C. Little Science Building on the U of M Central Campus.

New Note. If you do not find the technique you wish to use listed on our pages, please check our Other Links page for other UM facilities. If that fails contact John Mansfield (jfmjfm@umich.edu or (734) 936-3352) and he may be able to direct you to an alternate resource.