EMAL Seminar Series
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Professor Brendan
J. Griffin
Associate Professor And Director of the
Centre for Microscopy and Microanalysis at
the
University of Western Australia
10 AM, Wednesday, May 11th, 2005
Room 2246, Space Research Building, University of Michigan, Ann Arbor,
MI 48109-2143
(Same building as the North Campus EMAL)
Recent experiences with nanoSIMS
50 ion probes, high resolution FEGSEM and variable pressure SEM in materials
characterization to the nanometre scale.
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Professor Brendan
J. Griffin
Associate Professor And Director of the
Centre for Microscopy and Microanalysis at
the
University of Western Australia
2 PM, Wednesday, May 11th, 2005
Room 2520, C.C. Little Building
Geological Sciences, University of Michigan
Ann Arbor, MI 48109-1063
(Same building as the Central Campus EMAL)
New Imaging and Microanalysis Opportunities
for the Geosciences
What more can we do – well
it really depends on your imagination!
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Dr. Jan Ringnalda
Product Manager, FEI Company
2PM, Wednesday, August 17th 2005
Room 2246, Space Research Building, University of Michigan, Ann Arbor, MI 48109-2143
(Same building as the North Campus EMAL, for directions click here)
The FEI Titan 80-300: A new tool for sub-Ångstrom aberration corrected
transmission electron microscopy.
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Dr. Mike Kersker
Vice President, JEOL USA Incorporated,
11 Dearborn Road, Peabody, MA 01960
2PM, Thursday, September 15th, 2005
Room 2246, Space Research Building, University of Michigan, Ann Arbor,
MI 48109-2143
(Same building as the North Campus EMAL, for directions click here)
A Corrected View of the Future: Electron Optical Aberration Correctors/Monochromators
at JEOL
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Professor Matthew R. Phillips
Microstructural Analysis Unit,
Faculty of Science,
University of Technology, Sydney
PO Box 123, Broadway, New South Wales, Sydney, Australia 2007
email: matthew.phillips@uts.edu.au
2PM, Monday, October 15th, 2005
Room 2246, Space Research Building, University of Michigan, Ann Arbor, MI 48109-2143
(Same building as the North Campus EMAL, for directions click
here)
Scanning Cathodoluminescence Microscopy and Spectroscopy of Opto-Electronic
Materials
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Dr. Thomas F. Kelly
Founder, Chairman & CTO,
Imago Scientific Instruments Corporation,
6300 Enterprise Lane, Madison, WI 53719 USA
email: tkelly@imago.com
11:30AM, Monday, November 14th, 2005
Room 2246, Space Research Building, University of Michigan, Ann Arbor, MI 48109-2143
(Same building as the North Campus EMAL, for directions click here)
Three-dimensional Compositional imaging at the atomic scale: Innovative Atom Probe Tomography
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Mike Kersker, Vice-President and TEM/SPM Product Manager at JEOL USA, Inc,
Robert Klie from the Center for Functional Nanomaterials at Brookhaven National Laboratory
Alan Nicholls, the director of the Research Service Facility in the Research Resources Center at the University of Illinois Chicago.
Tuesday, Wednesday and Thursday, June 27th, 28th and 29th, 2006
Lectures in room 2246, Space Research Building, University of Michigan, Ann Arbor, MI 48109-2143
(Same building as the North Campus EMAL, for directions click here). Labs in the JEOL 2010f room 431 EMAL.
Optimal Use of the JEOL 2010F for Advanced Transmission Electron Microscopy.
Presentations achived here.
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