EMAL - Seminars: Matthew Phillip's Seminar

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EMAL Seminar Number 5 in an Occasional Series

EMAL is pleased to present, in association with the Michigan branch of the National Nanotechnology Infrastructure Network, the following seminar:

Professor Matthew R. Phillips
Microstructural Analysis Unit, Faculty of Science, University of Technology, Sydney
PO Box 123, Broadway, New South Wales, Sydney, Australia 2007
Email: matthew.phillips@uts.edu.au
2PM, Monday, October 15th, 2005
Room 2246, Space Research Building, University of Michigan, Ann Arbor, MI 48109-2143
(Same building as the North Campus EMAL, for directions click here)

Scanning Cathodoluminescence Microscopy and Spectroscopy of
Opto-Electronic Materials

Cathodoluminescence microscopy and spectroscopy are powerful enabling techniques for the microcharacterisation of technologically important ceramics and semiconductors. Recent advances in scanning electron microscopy instrumentation and light detection tools have considerably expanded the microanalytical capabilities of the CL technique. In this talk, a brief introduction to CL theory and instrumentation will be presented along with some of the latest developments in CL analysis methods. A number of topical examples will be also discussed to demonstrate the utility of the CL microscopy and spectroscopy for the study of advanced opto-electronic materials, including GaN, InGaN, InN, ZnO and luminescent nano-particles.