Dislocations in Si-Ge Thin Film
TEM image of dislocations in a silicon and silicon-gremanium thin film system.
Image by John Mansfield
HREM Twin
Twin detail in alloy foil in HREM.
Si CBED
Silicon <111> convergent beam electron diffraction pattern, bright field disc showing 3m symmetry.
Pattern by John Mansfield
Soot particles on a holey caron film
TEM image of soot particles on a holey carbon support film.
Image by EMAL Staff
SEM Image of Au Coated AFM Tip
Scanning electron microscope image of a gold coated AFM tip. Recorded in the FEI Nova NanoLab.
Image by Aaron Tan.
Si Map on Semiconductor Chip
An X-ray energy dispersive spectormetry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield
Dislocations in Si-Ge Thin Film
TEM image of dislocations in a silicon and silicon-gremanium thin film system.
Image by John Mansfield
