Soot particles on a holey caron film
TEM image of soot particles on a holey carbon support film.
Image by EMAL Staff
BF and DF pair of Gamma/Gamma'
Transmission electron microscope bright field (left) and dark field (right) image pair of a thin film of a gamma/gamma' nickel based superalloy.
Image by EMAL Staff
HREM image of grains of silicon nitride
Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.
Image by Pan Group
SEM CdTe Nanotube Rosette
Scanning electron microscope image a cluster of nanotubes of cadmium telluride.
Image by John Mansfield
M23X6 Crocodile
A precipitate of M23X6 in a 316 stainless steeel sample. Fringes are the dislcations at the interfaces between the matrix and the precipitate.
Image by John Mansfield
Al Map on Semiconductor Chip
An X-ray energy dispersive spectormetry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield.
Soot particles on a holey caron film
TEM image of soot particles on a holey carbon support film.
Image by EMAL Staff