Si CBED
Silicon <111> convergent beam electron diffraction pattern, bright field disc showing 3m symmetry.
Pattern by John Mansfield
HREM Twin
Twin detail in alloy foil in HREM.
HREM image of grains of silicon nitride
Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.
Image by Pan Group
Ridged Morphology of Aluminum Oxide formed on Ni-Al-Cr-W superalloy
Surface oxide formed during oxidation of experimental W-rich Ni-base superalloys in simulated impure-He environment. SE image recorded on Philips XL30 FEG SEM at 20kV
Image by Raghav Adharapurapu, Prof. Pollock's Research Group
Soot particles on a holey caron film
TEM image of soot particles on a holey carbon support film.
Image by EMAL Staff
Pt Doped BaCeO3
HAADF STEM image of a bright Pt particle in barium cerium oxide.
Image by Shuyi Zhang from the Pan Research Group.
Si CBED
Silicon <111> convergent beam electron diffraction pattern, bright field disc showing 3m symmetry.
Pattern by John Mansfield
