Scanning electron microscope image a cluster of nanotubes of cadmium telluride.Image by John Mansfield
A high angle annular dark field scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.Image by FEI
SE image of a PGM-modified NiAl Bond Coat deposited on Rene N5 Ni-superalloy substrate that underwent cyclic oxidation at 1150 deg C for 512 cycles. SE image recorded on Philips XL30 ESEM at 20kV.Image by Raghav Adharapurapu, Prof. Pollock's Research Group
A precipitate of M23X6 in a 316 stainless steeel sample. Fringes are the dislcations at the interfaces between the matrix and the precipitate.Image by John Mansfield
TEM image of dislocations in a silicon and silicon-gremanium thin film system.Image by John Mansfield
Scanning electron microscope image of a gold coated AFM tip. Recorded in the FEI Nova NanoLab.Image by Aaron Tan.
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