Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.Image by Kevin Grossklaus, Millunchick Research Group
Surface carbides formed during carburization of experimental W- and Re-rich Ni-base superalloys. BSE image recorded on Philips XL30 FEGSEM at 20kV.Image by Raghav Adharapurapu, Prof. Pollock's Research Group
Convergent beam electron diffraction pattern of M23X6, a metal carbo-nitro-boride common in steels.Pattern by John Mansfield
SEM image of the structure of crystals of Fe2O3 grown by chemical vapor deposition. The largest cluster is ~2µm in diameter.Image by Michelle Przybylek from the Linic Research Group.
Digitally enhanced HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.Image by Shuyi Zhang from the Pan Research Group.
SEM image of porous silicon.Image by EMAL Staff
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