Scanning electron microscope image of a gold coated AFM tip. Recorded in the FEI Nova NanoLab.Image by Aaron Tan.
Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.
ZnO "barbed wire" crystals grown on carbon nanotubes.Image by John Hart Group
SEM Image.Image by Ashley Bielinski, the Dasgupta Research Group.
SE image of a PGM-modified NiAl Bond Coat deposited on Rene N5 Ni-superalloy substrate that underwent cyclic oxidation at 1150 deg C for 512 cycles. SE image recorded on Philips XL30 ESEM at 20kV.Image by Raghav Adharapurapu, Prof. Pollock's Research Group
An XEDS map of a semiconductor chip, green is the silicon K alpha line, yellow is the gols M alpha line and red the carbon K line.Image by John Mansfield
*Note there are TWO basements in the building, the North Campus EMAL is in the west basement and the rooms of the laboratory are shaded in yellow.
Map of North Campus EMAL (Offices and Instruments
Map of Whole Building
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