Selected area diffraction pattern of alloy phase with strong structure factor intensity variation in the 00X spots.Image by John Mansfield
HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.Image by Shuyi Zhang from the Pan Research Group.
Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.Image by Kevin Grossklaus, Millunchick Research Group
SEM image of nanotube forests assembled into the likeness of Barack Obama.Image by Sameh Tawfick
SEM image of porous silicon.Image by EMAL Staff
Transmission electron microscope bright field (left) and dark field (right) image pair of a thin film of a gamma/gamma' nickel based superalloy.Image by EMAL Staff
*Note there are TWO basements in the building, the North Campus EMAL is in the west basement and the rooms of the laboratory are shaded in yellow.
Map of North Campus EMAL (Offices and Instruments
Map of Whole Building
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