Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.
Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.
An X-ray energy dispersive spectrometry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield
Medium magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.
Image by Shuyi Zhang from the Pan Research Group.
SEM image of porous silicon.
Image by EMAL Staff
Surface oxide formed during oxidation of experimental W-rich Ni-base superalloys in simulated impure-He environment. SE image recorded on Philips XL30 FEG SEM at 20kV
Image by Raghav Adharapurapu, Prof. Pollock's Research Group
Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.
Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.
*Note there are TWO basements in the building, the North Campus EMAL is in the west basement and the rooms of the laboratory are shaded in yellow.
Map of North Campus EMAL (Offices and Instruments
Map of Whole Building
