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Michigan Seal Milled into InAs using a Focused Ion Beam

SEM image of a University of Michigan seal milled into an InAs wafer using a low current focused ion beam (FIB) and low ion dose. The outer diameter of the seal is ~ 9.7 µm.
Image by Kevin Grossklaus, Millunchick Research Group.

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Michigan Seal Milled into InAs using a Focused Ion Beam

SEM image of a University of Michigan seal milled into an InAs wafer using a low current focused ion beam (FIB) and low ion dose. The outer diameter of the seal is ~ 9.7 µm.
Image by Kevin Grossklaus, Millunchick Research Group.

Bev Clampit

Bev Clampit

Administrative Assistant (North Campus)

Address:
Electron Microbeam Analysis Laboratory (North Campus)
University of Michigan
417 Space Research Building
Ann Arbor, MI 48109-2143

E-mail: bclampit@umich.edu
Phone: (734) 763-1041
Fax: (734) 763-2282

Bev is responsible for:
EMAL and MSE Lab billing and the entry of new users in EMAL's database system.

She assists lab users who have questions or problems.

She is responsible for account reconciliations, p-card reconciliations, purchasing and administrative support for EMAL and EMAL staff.

Schedule
Bev's normal schedule is 8am to 4:30pm from Monday to Thursday