HREM image of grains of silicon nitride
Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.
Image by Pan Group
X-ray Composite Map of Chip
An XEDS map of a semiconductor chip, green is the silicon K alpha line, yellow is the gols M alpha line and red the carbon K line.
Image by John Mansfield
Carbon Nanotubes Modified with an Ultrafast Laser
Low magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
Au Particle Formed on Au/BaTiO3 film
Scanning electron microscope image, recorded in the Hitachi S3200N SEM, of a small gold particle formed after heat treatment of a series of thin films of LaSrTiO3/BaTiO3 grown on top of a SrTiO3 substrate via pulse-laser deposition.
BF STEM Image of Copper Aluminum Precipitates
A scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.
Image by FEI
CBED of Metal Carbide
Convergent beam electron diffraction pattern of M23X6, a metal carbo-nitro-boride common in steels.
Pattern by John Mansfield
HREM image of grains of silicon nitride
Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.
Image by Pan Group
