HREM Twin
Twin detail in alloy foil in HREM.
Twin detail in alloy foil in HREM.
Low magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
An X-ray energy dispersive spectrometry map recorded using the Oxygen K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield
Transmission electron microscope image of a rossette of rutile titanium oxide in a matrix of anatase titanium oxide.
Image by John Mansfield
SEM image of porous silicon.
Image by EMAL Staff
InAs islands grown by molecular beam epitaxy on an InP substrate patterned by FIB milling. SE image recorded on FEI Nova Nanolab at 5 kV.
Image by Kevin Grossklaus, Prof. Mirecki-Millunchick's Research Group
Twin detail in alloy foil in HREM.
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Laboratory Manager (North Campus) & Associate Director Address: E-mail: jfmjfm@umich.edu |
Contact me for:
HREM, AEM, SEM, ESEM, AFM, XEDS, EELS, CBED:
Equipment training and problems in EMAL.
Schedule
My normal schedule is 9:00 a.m. to 5:30 p.m. Monday through Friday.
How to get training
E-mail me or call me to set up a training session, you can also call Kai Sun or e-mail him. Training takes a minimum of a couple of hours for the SEM. The TEMs are more specialized and can take much longer. For the TEM, we recommend you take the Electron Microscopy course MSE562 offered by the Materials Science and Engineering Department. This course usually includes a large lab component in addition to theory on the operation of the microscope.
Other Web Pages
John Mansfield's Professional Web page
John Mansfield's Personal Web Page
John Mansfield's Resume (CV) Web Page
John Mansfield's Publications WebPage