SADP
Selected area diffraction pattern of alloy phase with strong structure factor intensity variation in the 00X spots.
Image by John Mansfield
Selected area diffraction pattern of alloy phase with strong structure factor intensity variation in the 00X spots.
Image by John Mansfield
Twin detail in alloy foil in HREM.
Surface carbides formed during carburization of experimental W- and Re-rich Ni-base superalloys. BSE image recorded on Philips XL30 FEGSEM at 20kV.
Image by Raghav Adharapurapu, Prof. Pollock's Research Group
A precipitate of M23X6 in a 316 stainless steeel sample. Fringes are the dislcations at the interfaces between the matrix and the precipitate.
Image by John Mansfield
HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.
Image by Shuyi Zhang from the Pan Research Group.
Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.
Image by Kevin Grossklaus, Millunchick Research Group
Selected area diffraction pattern of alloy phase with strong structure factor intensity variation in the 00X spots.
Image by John Mansfield
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Assistant Research ScientistTEM Trainer (Central Campus) |
Address:
Central Campus Electron Microbeam Analysis Laboratory
Department of Earth and Environmental Sciences,
R.B. Mitchell Laboratory
2509 C.C. Little Building
University of Michigan
Ann Arbor, MI 48109-1005
E-mail: aschleic@umich.edu
Phone: (734) 615-6657
Contact me for:
TEM, XRD and X-ray texture goniometer (XTG) and specimen preparation equipment
Training and problems in Central Campus EMAL.
Schedule
I am in EMAL in the mornings, Monday through Friday.
How to get training on the central campus TEM (CM12)
E-mail me or call me to set up a training session