HAADF STEM Image of Copper Aluminum Precipitates
A high angle annular dark field scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.
Image by FEI
O Map on Semiconductor Chip
An X-ray energy dispersive spectormetry map recorded using the Oxygen K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield
Carbon Nanotubes Modified with an Ultrafast Laser
Medium magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
Nanobamas
SEM image of nanotube forests assembled into the likeness of Barack Obama.
Image by Sameh Tawfick
Au Particle Formed on Au/BaTiO3 film
Scanning electron microscope image, recorded in the Hitachi S3200N SEM, of a small gold particle formed after heat treatment of a series of thin films of LaSrTiO3/BaTiO3 grown on top of a SrTiO3 substrate via pulse-laser deposition.
Porous Si at Low Magnification
SEM image of porous silicon.
Image by EMAL Staff
HAADF STEM Image of Copper Aluminum Precipitates
A high angle annular dark field scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.
Image by FEI
