Scanning electron microscope image, recorded in the Hitachi S3200N SEM, of a small gold particle formed after heat treatment of a series of thin films of LaSrTiO3/BaTiO3 grown on top of a SrTiO3 substrate via pulse-laser deposition.
Medium magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
An X-ray energy dispersive spectrometry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield.
SEM image of porous silicon.
Image by EMAL Staff
High magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
SEM image of a University of Michigan seal milled into an InAs wafer using a low current focused ion beam (FIB) and low ion dose. The outer diameter of the seal is ~ 9.7 µm.
Image by Kevin Grossklaus, Millunchick Research Group.
Scanning electron microscope image, recorded in the Hitachi S3200N SEM, of a small gold particle formed after heat treatment of a series of thin films of LaSrTiO3/BaTiO3 grown on top of a SrTiO3 substrate via pulse-laser deposition.
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Research Associate (North Campus) Address: E-mail: haipings@umich.edu |
Contact me for:
TEM, STEM, SEM, FIB.
Equipment training and problems in EMAL.
Schedule
My normal schedule is 8:30 AM to 12:00 and 1:00 PM to 5:30 PM Monday through Friday.
How to get training
E-mail me or call me to set up a training session for any of the instruments listed above. You should include in your email some information on your sample and what it is you are trying to discover. You shoudl also tell me if you have any prior experience in the technique that you believe is applicable. Training usually takes a couple of hours for the SEM. The TEMs are more specialized and can take much longer. For example, to become familiar with the TEM, we recommend you take the Electron Microscopy course, MSE-562, offered in the winter term by the Materials Science and Engineering Department. This course includes a large lab component in addition to theory on the operation of the microscope.