TEM image of dislocations in a silicon and silicon-gremanium thin film system.
Image by John Mansfield
Surface oxide formed during oxidation of experimental W-rich Ni-base superalloys in simulated impure-He environment. SE image recorded on Philips XL30 FEG SEM at 20kV
Image by Raghav Adharapurapu, Prof. Pollock's Research Group
Surface carbides formed during carburization of experimental W- and Re-rich Ni-base superalloys. BSE image recorded on Philips XL30 FEGSEM at 20kV.
Image by Raghav Adharapurapu, Prof. Pollock's Research Group
ZnO "barbed wire" crystals grown on carbon nanotubes.
Image by John Hart Group
High magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
Scanning electron microscope image a cluster of nanotubes of cadmium telluride.
Image by John Mansfield
TEM image of dislocations in a silicon and silicon-gremanium thin film system.
Image by John Mansfield
Phone: 763-1041, 936-3349, or 936-3350
There are currently no undergraduate research assistants working in EMAL. If you would like to work for EMAL, please send email to John Mansfield. We welcome student workers who want laboratory experience, particularly Work Study students.
