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Dislocations in a strained InGaAs film

Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.

Image by Kevin Grossklaus, Millunchick Research Group

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Dislocations in a strained InGaAs film

Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.

Image by Kevin Grossklaus, Millunchick Research Group

User Statistics: March 2008

The North Campus Branch is maintained by 3.2 members of the Department of Materials Science and Engineering in the College of Engineering: John Mansfield (1), Kai Sun (1), Haiping Sun (1), and Ying Qi (0.2).

The North Campus Branch is maintained by 2.0 members of the Department of Geological Sciences in the College of Literature Sciences and the Arts: Carl Henderson and Anja Schleicher.

In FY 2010, 454 different people came to use the North Campus EMAL facility. 2010 also saw 222 new users requiring training by EMAL staff on one or more instruments.

Check out some more of the statistics below.

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