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SEM Image of Au Coated AFM Tip

Scanning electron microscope image of a gold coated AFM tip. Recorded in the FEI Nova NanoLab.

Image by Aaron Tan.

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SEM Image of Au Coated AFM Tip

Scanning electron microscope image of a gold coated AFM tip. Recorded in the FEI Nova NanoLab.

Image by Aaron Tan.

Contact

Central Campus Electron Microbeam Analysis Laboratory
Geological Sciences
R.B. Mitchell Laboratory
2005 C.C. Little Building
University of Michigan
Ann Arbor MI 48109-1063
Email: CC.EMAL.Info@umich.edu
Phone: (734) 615-6657
FAX: (734) 763-4690

North Campus Electron Microbeam Analysis Laboratory
Space Research Building
University of Michigan
2455 Hayward
Ann Arbor MI 48109-1063
Email: N.C.EMAL.Info@umich.edu
Phone: (734) 936-3352
FAX: (734) 763-2282

EMAL Advisory Committee
EMAL's Governing body.