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Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

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Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

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Central Campus Electron Microbeam Analysis Laboratory
Geological Sciences
R.B. Mitchell Laboratory
2005 C.C. Little Building
University of Michigan
Ann Arbor MI 48109-1063
Email: CC.EMAL.Info@umich.edu
Phone: (734) 615-6657
FAX: (734) 763-4690

North Campus Electron Microbeam Analysis Laboratory
Space Research Building
University of Michigan
2455 Hayward
Ann Arbor MI 48109-1063
Email: N.C.EMAL.Info@umich.edu
Phone: (734) 936-3352
FAX: (734) 764-2931

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EMAL's Governing body.