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SADP

Selected area diffraction pattern of alloy phase with strong structure factor intensity variation in the 00X spots.

Image by John Mansfield

X-ray Composite Map of Chip
An XEDS map of a semiconductor chip, green is the silicon K alpha line, yellow is the gols M alpha line and red the carbon K line.

Image by John Mansfield
Si CBED
Silicon <111> convergent beam electron diffraction pattern, bright field disc showing 3m symmetry.

Pattern by John Mansfield
Si Map on Semiconductor Chip
An X-ray energy dispersive spectormetry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield
ZnO crystals grown on Carbon Nanotubes
ZnO "barbed wire" crystals grown on carbon nanotubes.

Image by John Hart Group
Geological XEDS Map
Geological section of mulitples phases with various levles of Ca within them. Image recorded in Ca K Alpha line.

Image by Bob Anderhalt

SADP

Selected area diffraction pattern of alloy phase with strong structure factor intensity variation in the 00X spots.

Image by John Mansfield

Contact

Central Campus Electron Microbeam Analysis Laboratory
Geological Sciences
R.B. Mitchell Laboratory
2005 C.C. Little Building
University of Michigan
Ann Arbor MI 48109-1063
Email: CC.EMAL.Info@umich.edu
Phone: (734) 615-6657
FAX: (734) 763-4690

North Campus Electron Microbeam Analysis Laboratory
Space Research Building
University of Michigan
2455 Hayward
Ann Arbor MI 48109-1063
Email: N.C.EMAL.Info@umich.edu
Phone: (734) 936-3352
FAX: (734) 763-2282

EMAL Executive Committee
EMAL's Governing body.

SADP

X-ray Composite Map of Chip

Si CBED

Si Map on Semiconductor Chip

ZnO crystals grown on Carbon Nanotubes

Geological XEDS Map

SADP

Contact