The Transmission Electron Microscope: A Tool for Diffraction & Imaging in Materials Science & Engineering

The Transmission Electron Microscope: A Tool for Diffraction & Imaging in Materials Science & Engineering 3/24/00 Click here to start

Table of Contents The Transmission Electron Microscope: A Tool for Diffraction & Imaging in Materials Science & Engineering Lecture Outline Lecture Outline - What is a TEM? What is a TEM? What is a TEM? Explanation of features. Electron Beam Source Schematic of the Optics of a Transmission Electron Microscope Schematic Diagram of Crude Electron Lens Lecture Outline - Examples Instruments Modern TEMs Lecture Outline - Why use electrons? Why Electrons? Why Electrons? (2) Resolution limited by lens aberrations Lecture Outline - Forming an Image in TEM Diagram of Thin Transmitting Specimen Imaging in the TEM Selected Area Diffraction Selected Area Diffraction - Basic Features of an Analytical Electron Microscope Selected Area Diffraction - Selected area aperture inserted in image plane Selected Area Electron Diffraction Pattern recorded from both BN film & Si substrate Example of Cross sectional TEM. Defect Imaging in the TEM Defect Imaging - Extension dislocations between the matrix Diffraction Pattern recorded from both BN film & Si substrate - "Normal" Dark Field Micrograph of a Ni8Ge8Al alloy Diffraction Pattern recorded from both BN film & Si substrate - Phase Contrast Silicon <111> HREM Structure Image JEOL 4000EX 1.75Å resolution. Example High Resolution Electron Microscope Image - Grain Boundary Film Summary of Diffraction and Phase Contrast Imaging Lecture Outline - The Ewald Sphere Why are there so many spots? The Ewald Sphere High Energy Electron Ewald Sphere Lecture Outline - Diffraction Techniques in TEM Selected Area Diffraction Diffraction pattern from M23X6 in Austenite Convergent Beam Electron Diffraction <111> Cr ZAP Formation of HOLZ rings HOLZ lines - Deficit in ZOLZ/Excess in HOLZ Direct Disc Si <111> ZAP HOLZ Example Electron Diffraction Uses <001> CBED ZAPs from Si & SiGe Alloys [011] Er2O3 - Point Group Determination Phase Fingerprinting Example: M23 X6 <110> ZAP Two Beam Thickness Determination The Ending Slide		Author: John F. Mansfield Email: jfmjfm@umich.edu Home Page: http://emalwww.engin.umich.edu/ Download presentation source
Copyright © 2004 EMAL & MSE Department, University of Michigan & John F. Mansfield ( jfmjfm@umich.edu)