Convergent Beam Electron Diffraction & Itís Applications John F. Mansfield University of Michigan Electron Microbeam Analysis Laboratory

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Table of Contents Convergent Beam Electron Diffraction & It's Applications John F. Mansfield University of Michigan Electron Microbeam Analysis Laboratory Outline Outline - Introduction to CBED Why CBED SAD Example CBED Example Points in discs How to obtain CBED patterns Poor Pattern Example Learning CBED Sample Orientation Viewing the shadow image in CBED mode Final Pattern Centering Cr <111>XZAP X-ray Ewald High Energy Electron Ewald Sphere HOLZ Example HOLZ spacings Excess/Deficit Si <111>ZAP Problems getting patterns More Problems? Microscope Related Criteria Specimen Related Criteria Outline - Applications Examples CBED Applications Examples Phase Identification Laves Partial Zap Map Poor Quality Laves ZAP Stererogram for Laves Calculated Kikuchi Map for Laves Laves XEDS spectrum Laves Particle Symmetry Determination Assume semi-infinite crystal Point group 1 Buxton et al tables Buxton et al tables 2 Point group 2 Point group 3 Point Group Determination Symmetry Deviations Dynamic Absences 1 Dynamic Absences 2 Dynamic Absences 3 Dynamic Absences 4 Dynamic Absences 5 What Dynamic Absences Mean HOLZ Dark Bars Space Group More on Dark Bars Phase Fingerprinting Phase Fingerprinting Example: M23 X6 <110>ZAP Phase Fingerprinting Atlas Thickness Measurement Thickness Measurement Theory 1 Thickness Measurement Theory 2 Thickness Measurement Theory 3 Thickness Measurement Theory Graph Thickness Measurement Theory Diagram Thickness Measurement in NIH Image 1 Thickness Measurement in NIH Image 2 Thickness Measurement in NIH Image 3 Thickness Measurement in NIH Image 4 Thickness Measurement in NIH Image 5 Thickness Measurement in NIH Image 6 Strain /lattice Parameter Measurement <001>CBED ZAPs from Si /SiGe Alloys Calculated Patterns Structure Factor Determination Structure Factor Determination 1 Structure Factor Determination 2 Energy Filter Patterns Si <110>filtered pattern Fitting Routine. Fitting Parameters. Fitting Variables. Fit Results. X-ray and Electron Structure Factors for Cu Abbreviations		Author: John F. Mansfield Email: jfmjfm@engin.umich.edu Home Page: http://emalwww.engin.umich.edu/people/jfmjfm/ Other information: John Mansfield North Campus Electron Microbeam Analysis Laboratory University of Michigan 2455 Hayward Street #417 Ann Arbor Michigan 48109-2143 Phone: (734) 936-3352 FAX: (734) 763-5567 Cell: (734) 715-2510 Location: Lat. 42 16' 48" Long. 83 43' 48" Download presentation source
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