Table of Contents

Introduction to The Scanning Electron Microscope based closely on the notes of Wilbur Bigelow Emeritus Professor of Materials Science & Engineering & Former Director of EMAL
The Scanning Electron Microscope Basic Operation (figures by John Mansfield)
Back Scattered Electrons: Back Scattered Electrons Range and Depth of the BSE Signal The Effect of Surface Tilt on the BSE Signal BSE Detectors A Scintillator-Light Guide-PMT Detector The 'Robinson' Detector Channel Plate Detectors Solid State Diode Detector		Secondary Electron: Secondary Electrons The effect of Surface Tilt The Secondary Electron Detector BSE Contamination of the SE Signal Working at Low Beam Accelerating Voltages
Image Formation in the SEM: Image Formation in the SEM Magnification Relationships in the SEM The 'Picture Element' or 'Pixel' Focus Useful Magnification Image Contrast ImageQuality Detectable Contrast		Focused Beam Spot Size: Focused Beam Spot Size Beam Current Reaching the Sample Depth of Focus
Modern SEMs