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HAADF STEM Image of Copper Aluminum Precipitates

A high angle annular dark field scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.

Image by FEI

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HAADF STEM Image of Copper Aluminum Precipitates

A high angle annular dark field scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.

Image by FEI

EMAL Techniques Seminars

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Basic Introduction to TEM
John Mansfield - North Campus EMAL, U of MI.
30 Sept 2009.
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Introduction to X-ray Energy Dispersive Spectrometry in the Electron Microscope
John Mansfield - North Campus EMAL, U of MI.
23 Sept 2009.

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