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Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

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Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

EMAL Techniques Seminars

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Basic Introduction to TEM
John Mansfield - North Campus EMAL, U of MI.
30 Sept 2009.
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Introduction to X-ray Energy Dispersive Spectrometry in the Electron Microscope
John Mansfield - North Campus EMAL, U of MI.
23 Sept 2009.

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