Porous Si at High Magnification
SEM image of porous silicon.
Image by EMAL Staff
SEM image of porous silicon.
Image by EMAL Staff
A precipitate of M23X6 in a 316 stainless steeel sample. Fringes are the dislcations at the interfaces between the matrix and the precipitate.
Image by John Mansfield
Scanning electron microscope image of a gold coated AFM tip. Recorded in the FEI Nova NanoLab.
Image by Aaron Tan.
High magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.
Image by John Mansfield
SEM image of nanotube forests assembled into the likeness of Barack Obama.
Image by Sameh Tawfick
Geological section of mulitples phases with various levles of Ca within them. Image recorded in Ca K Alpha line.
Image by Bob Anderhalt
SEM image of porous silicon.
Image by EMAL Staff
The following tutorials, lectures, short courses, web course, etc. are offered by personnel in the field of microscopy from across the globe. Some are presented by people associated with the University of Michigan Electron Microbeam Analysis Laboratory, often as part of full fledged courses such as MSE-562.