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HREM image of grains of silicon nitride

Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.

Image by Pan Group

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HREM image of grains of silicon nitride

Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.

Image by Pan Group

Microscopy Teaching & Learning Resources

The following tutorials, lectures, short courses, web course, etc. are offered by personnel in the field of microscopy from across the globe.   Some are presented by people associated with the University of Michigan Electron Microbeam Analysis Laboratory, often as part of full fledged courses such as MSE-562.