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Si Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield

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Si Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield

Document for inclusion in NSF Proposals

The following document is designed to allow persons submitting a proposal to easily submit material to the proposal section labeled "Facilities, Equipment, and Other Resources. See below for descriptions of EMAL equipment, personnel and managemment. The links provide the document in both PDF and Microsoft Word .doc format