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Dislocations in a strained InGaAs film

Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.

Image by Kevin Grossklaus, Millunchick Research Group

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Dislocations in a strained InGaAs film

Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.

Image by Kevin Grossklaus, Millunchick Research Group

Document for inclusion in NSF Proposals

The following document is designed to allow persons submitting a proposal to easily submit material to the proposal section labeled "Facilities, Equipment, and Other Resources. See below for descriptions of EMAL equipment, personnel and managemment. The links provide the document in both PDF and Microsoft Word .doc format