Play
Close
M23X6croc.jpg

M23X6 Crocodile

A precipitate of M23X6 in a 316 stainless steeel sample. Fringes are the dislcations at the interfaces between the matrix and the precipitate.

Image by John Mansfield

Caption Arrow

M23X6 Crocodile

A precipitate of M23X6 in a 316 stainless steeel sample. Fringes are the dislcations at the interfaces between the matrix and the precipitate.

Image by John Mansfield

Seminars & Workshops

  1. Professor Brendan J. Griffin
    Associate Professor And Director of the Centre for Microscopy and Microanalysis at the University of Western Australia
     10 AM, Wednesday, May 11th, 2005
    Room 2246, Space Research Building, University of Michigan, Ann Arbor, MI 48109-2143
    (Same building as the North Campus EMAL)
    Recent experiences with nanoSIMS 50 ion probes, high resolution FEGSEM and variable pressure SEM in materials characterization to the nanometre scale.
  2. Professor Brendan J. Griffin
    Associate Professor And Director of the Centre for Microscopy and Microanalysis at the University of Western Australia
    2 PM, Wednesday, May 11th, 2005
    Room 2520, C.C. Little Building
    Geological Sciences, University of Michigan
    Ann Arbor, MI 48109-1063
    (Same building as the Central Campus EMAL)
    New Imaging and Microanalysis Opportunities for the Geosciences
    What more can we do – well it really depends on your imagination!
  3. Dr. Jan Ringnalda
    Product Manager, FEI Company
    2PM, Wednesday, August 17th 2005
    Room 2246, Space Research Building, University of Michigan, Ann Arbor, MI 48109-2143
    (Same building as the North Campus EMAL, for directions click here)
    The FEI Titan 80-300: A new tool for sub-Ångstrom aberration corrected transmission electron microscopy.
  4. Dr. Mike Kersker
    Vice President, JEOL USA Incorporated, 11 Dearborn Road, Peabody, MA 01960
    2PM, Thursday, September 15th, 2005
    Room 2246, Space Research Building, University of Michigan, Ann Arbor, MI 48109-2143
    (Same building as the North Campus EMAL, for directions click here)
    A Corrected View of the Future: Electron Optical Aberration Correctors/Monochromators at JEOL
  5. Professor Matthew R. Phillips
    Microstructural Analysis Unit, Faculty of Science, University of Technology, Sydney
    PO Box 123, Broadway, New South Wales, Sydney, Australia 2007
    email: matthew.phillips@uts.edu.au
    2PM, Monday, October 15th, 2005
    Room 2246, Space Research Building, University of Michigan, Ann Arbor, MI 48109-2143
    (Same building as the North Campus EMAL, for directions click here)
    Scanning Cathodoluminescence Microscopy and Spectroscopy of Opto-Electronic Materials
  6. Dr. Thomas F. Kelly
    Founder, Chairman & CTO, Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719 USA
    email: tkelly@imago.com
     11:30AM, Monday, November 14th, 2005
    Room 2246, Space Research Building, University of Michigan, Ann Arbor, MI 48109-2143
    (Same building as the North Campus EMAL, for directions click here)
    Three-dimensional Compositional imaging at the atomic scale: Innovative Atom Probe Tomography
  7. Mike Kersker, Vice-President and TEM/SPM Product Manager at JEOL USA, Inc,
    Robert Klie from the Center for Functional Nanomaterials at Brookhaven National Laboratory
    Alan Nicholls, the director of the Research Service Facility in the Research Resources Center at the University of Illinois Chicago.
    Tuesday, Wednesday and Thursday, June 27th, 28th and 29th, 2006
    Lectures in room 2246, Space Research Building, University of Michigan, Ann Arbor, MI 48109-2143
    (Same building as the North Campus EMAL, for directions click here). Labs in the JEOL 2010f room 431 EMAL.
    Optimal Use of the JEOL 2010F for Advanced Transmission Electron Microscopy.

    Presentations achived here.