SEM Image of Au Coated AFM Tip
Scanning electron microscope image of a gold coated AFM tip. Recorded in the FEI Nova NanoLab.
Image by Aaron Tan.
Scanning electron microscope image of a gold coated AFM tip. Recorded in the FEI Nova NanoLab.
Image by Aaron Tan.
TEM image of dislocations in a silicon and silicon-gremanium thin film system.
Image by John Mansfield
HAADF STEM image of a bright Pt particle in barium cerium oxide.
Image by Shuyi Zhang from the Pan Research Group.
Twin detail in alloy foil in HREM.
Convergent beam electron diffraction pattern of M23X6, a metal carbo-nitro-boride common in steels.
Pattern by John Mansfield
SE image of a PGM-modified NiAl Bond Coat deposited on Rene N5 Ni-superalloy substrate that underwent cyclic oxidation at 1150 deg C for 512 cycles. SE image recorded on Philips XL30 ESEM at 20kV.
Image by Raghav Adharapurapu, Prof. Pollock's Research Group
Scanning electron microscope image of a gold coated AFM tip. Recorded in the FEI Nova NanoLab.
Image by Aaron Tan.
This EMAL Videos section contains a series of presentations that were recorded with the College of Engineering's Lecture Capture System. This system records not only the slides presented to the audience, but also syncs them with audio and video of the presenter. This system was developed in the College of Engineering in 2005 by Phil Treib, the Computer Aided Engineering Network's director of instructional technology (see here). EMAL presentations will typically be recorded and made available on this section of the EMAL Web Site.