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Si Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield

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Si Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield

EMAL Videos

This EMAL Videos section contains a series of presentations that were recorded with the College of Engineering's Lecture Capture System. This system records not only the slides presented to the audience, but also syncs them with audio and video of the presenter. This system was developed in the College of Engineering in 2005 by Phil Treib, the Computer Aided Engineering Network's director of instructional technology (see here). EMAL presentations will typically be recorded and made available on this section of the EMAL Web Site.