Al Map on Semiconductor Chip
An X-ray energy dispersive spectormetry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield.
Porous Si at High Magnification
SEM image of porous silicon.
Image by EMAL Staff
Dislocations in Si-Ge Thin Film
TEM image of dislocations in a silicon and silicon-gremanium thin film system.
Image by John Mansfield
Nanobamas
SEM image of nanotube forests assembled into the likeness of Barack Obama.
Image by Sameh Tawfick
Soot particles on a holey caron film
TEM image of soot particles on a holey carbon support film.
Image by EMAL Staff
HREM image of grains of silicon nitride
Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.
Image by Pan Group
Al Map on Semiconductor Chip
An X-ray energy dispersive spectormetry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield.
icon below to view
the selected media.
