EMAL | Educational Materials & Publications

BF STEM Image of Copper Aluminum Precipitates

A scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.

Image by FEI

Bend contours in a Ni-8Al-4Ge alloy
Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.

Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.
Title: Description:
Fe₂O₃ "cauliflowers"
SEM image of the structure of crystals of Fe₂O₃ grown by chemical vapor deposition. The largest cluster is ~2µm in diameter.
Image by Michelle Przybylek from the Linic Research Group.
Pt Doped BaCeO₃
HAADF STEM image of a bright Pt particle in barium cerium oxide.
Image by Shuyi Zhang from the Pan Research Group.
Ridged Morphology of Aluminum Oxide formed on Ni-Al-Cr-W superalloy
Surface oxide formed during oxidation of experimental W-rich Ni-base superalloys in simulated impure-He environment. SE image recorded on Philips XL30 FEG SEM at 20kV

Image by Raghav Adharapurapu, Prof. Pollock's Research Group
Superlattice of SrTiO and BaFe₂As₂

Digitally enhanced HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe₂As₂.
Image by Shuyi Zhang from the Pan Research Group.

BF STEM Image of Copper Aluminum Precipitates

A scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.

Image by FEI

EMAL Videos

Click on a icon below to view the selected media.

Subscriptions are also available in these podcast formats:
Video Podcast | High Res Video Podcast | iPhone Video Podcast

4/22	Introduction to FIB Instrumentation Lecture 1, given by Lucille Giannuzzi, of "A Workshop on Focused Ion Beam Systems and Applications" 22nd April 2008.
4/22	Imaging with Ions Lecture 3a, given by Joe Michael, of "A Workshop on Focused Ion Beam Systems and Applications" 22nd April 2008.
4/22	Imaging with Ions Lecture 3b, given by Joe Michael, of "A Workshop on Focused Ion Beam Systems and Applications" 22nd April 2008.
4/22	Ion Solid Interactions Lecture 2, given by Joe Michael, of "A Workshop on Focused Ion Beam Systems and Applications" 22nd April 2008
4/23	SEM in the FIB Lecture 5, given by Joe Michael, of "A Workshop on Focused Ion Beam Systems and Applications" 22nd April 2008.
4/23	Micro and Nano Fabrication: Milling and Deposition for Nanoprototyping and Circuit Edit Lecture 4, given by Lucille Giannuzzi, of "A Workshop on Focused Ion Beam Systems and Applications" 23rd April 2008.
4/24	TEM Samples in the FIB Lecture 6, given by Lucille Giannuzzi, of "A Workshop on Focused Ion Beam Systems and Applications" 24th April 2008.
4/24	Milling and Deposition with the Aid of Gas Sources Lucille Giannuzzi, FEI Company, a special EMAL Techniques Seminar, September 24th, 2009. 24th April 2008. Please excuse the audio in the later parts of this presentation, there is some interference on the wireless microphone, I hope things are still decipherable.

These resources may require additional software be installed on your computer.

BF STEM Image of Copper Aluminum Precipitates

Bend contours in a Ni-8Al-4Ge alloy

Fe2O3 "cauliflowers"

Pt Doped BaCeO3

Ridged Morphology of Aluminum Oxide formed on Ni-Al-Cr-W superalloy

Superlattice of SrTiO and BaFe2As2

BF STEM Image of Copper Aluminum Precipitates

EMAL Videos

Fe₂O₃ "cauliflowers"

Pt Doped BaCeO₃

Superlattice of SrTiO and BaFe₂As₂