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Al Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield.

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Al Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield.

EMAL Videos

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10/21
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Recent Advances in Low kV Backscatter Imaging & Low kV Microanalysis.
Dr. Natasha Erdman
11/21
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From 2-D Images to 3-D Objects: Recent Progress
Professor Marc De Graef
Carnegie Mellon University
10/18/2010
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EBSD of Anisotropic Deformation and Damage Nucleation in Polycrystalline Ti Alloys
Professor Marty Crimp
Michigan State University
Presentation given as part of day-long seminar on EBSD, more presentations are here

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