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Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

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Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

EMAL & XMAL Facilities and Instruments

Handbooks
Since some of the user handbooks contain proprietary information, some of the manufacturers do not what them made available outside the university. In order to access the Handbooks webpage, you will need to use the standard username and password for EMAL users.

Software
Special software for microscopy analysis is available on EMAL data acquisiton and analysis computers. A good deal of them are documented in HTML and PDF in the EM Software pages. In order to access these software documents, you will need to use the standard username and password for EMAL users.

New users and instrument questions
If you want to use the facility and/or need training on any of the instruments, or have questions regarding EMAL policies and facility use, please contact the appropriate person for instrument training and refer to the Frequently Asked Questions/Help page. Information regarding general conditions of use and laboratory do's and don'ts are available and highly recommended reading for all EMAL users.

North Campus EMAL & XMAL Instruments

Central Campus EMAL & XMAL Instruments