Transmission electron microscope bright field (left) and dark field (right) image pair of a thin film of a gamma/gamma' nickel based superalloy.Image by EMAL Staff
A precipitate of M23X6 in a 316 stainless steeel sample. Fringes are the dislcations at the interfaces between the matrix and the precipitate.Image by John Mansfield
ESEM image of piece of bacon from visiting grdauate student breakfast March 2011. Image recorded on the FEI Quanta 3D at 30kV and 0.5Torr of water vapor.Image by John Mansfield
A high angle annular dark field scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.Image by FEI
An X-ray energy dispersive spectrometry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.Image by John Mansfield.
Medium magnification image of 500nm film of NiTi sputtered on carbon nanotube forest. SE image on Nova Nanolab taken at 10 kV.Image taken by Anne Juggernauth
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