Silicon <111> convergent beam electron diffraction pattern, bright field disc showing 3m symmetry.Pattern by John Mansfield
Medium magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.Image by John Mansfield
Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.
Low magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.Image by John Mansfield
Scanning electron microscope image of a gold coated AFM tip. Recorded in the FEI Nova NanoLab.Image by Aaron Tan.
An X-ray energy dispersive spectrometry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.Image by John Mansfield
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