Scanning electron microscope image of a gold coated AFM tip. Recorded in the FEI Nova NanoLab.Image by Aaron Tan.
An X-ray energy dispersive spectrometry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.Image by John Mansfield
Silicon <111> convergent beam electron diffraction pattern, bright field disc showing 3m symmetry.Pattern by John Mansfield
Selected area diffraction pattern of alloy phase with strong structure factor intensity variation in the 00X spots.Image by John Mansfield
SEM image of the structure of crystals of Fe2O3 grown by chemical vapor deposition. The largest cluster is ~2µm in diameter.Image by Michelle Przybylek from the Linic Research Group.
SE image of a PGM-modified NiAl Bond Coat deposited on Rene N5 Ni-superalloy substrate that underwent cyclic oxidation at 1150 deg C for 512 cycles. SE image recorded on Philips XL30 ESEM at 20kV.Image by Raghav Adharapurapu, Prof. Pollock's Research Group
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