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Au Particle Formed on Au/BaTiO3 film

Scanning electron microscope image, recorded in the Hitachi S3200N SEM, of a small gold particle formed after heat treatment of a series of thin films of LaSrTiO3/BaTiO3 grown on top of a SrTiO3 substrate via pulse-laser deposition.

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Au Particle Formed on Au/BaTiO3 film

Scanning electron microscope image, recorded in the Hitachi S3200N SEM, of a small gold particle formed after heat treatment of a series of thin films of LaSrTiO3/BaTiO3 grown on top of a SrTiO3 substrate via pulse-laser deposition.

Enraf Nonius CAD4 Single Crystal X-Ray Diffractometer

Location: 2501B C. C. Little Building
Contact: Anja Schleicher
Acknowledgments: Funding for this instrument came from a variety of sources, publication acknowledgements should refer to the support of the University of Michigan Electron Microbeam Analysis Laboratory

Enraf Nonius CAD4 Single Crystal X-Ray Diffractometer: The CAD4 is a single crystal X-ray diffractometer which has been modified for XTG (X-ray Texture Goniometry) to collect fabric measurements on phyllosilicate-bearing rock samples.

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CAD4 XRD The Enraf Nonius CAD4 Single Crystal X-Ray Diffractometer