EMAL | Facilities & Instruments

HREM Twin

Twin detail in alloy foil in HREM.

Si Map on Semiconductor Chip
An X-ray energy dispersive spectormetry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield
Nanobamas
SEM image of nanotube forests assembled into the likeness of Barack Obama.

Image by Sameh Tawfick
O Map on Semiconductor Chip
An X-ray energy dispersive spectormetry map recorded using the Oxygen K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield
Soot particles on a holey caron film
TEM image of soot particles on a holey carbon support film.

Image by EMAL Staff
Al Map on Semiconductor Chip
An X-ray energy dispersive spectormetry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield.

HREM Twin

Twin detail in alloy foil in HREM.

Enraf Nonius CAD4 Single Crystal X-Ray Diffractometer

Location: 2501B C. C. Little Building
Contact: Anja Schleicher
Acknowledgments: Funding for this instrument came from a variety of sources, publication acknowledgements should refer to the support of the University of Michigan Electron Microbeam Analysis Laboratory

Enraf Nonius CAD4 Single Crystal X-Ray Diffractometer: The CAD4 is a single crystal X-ray diffractometer which has been modified for XTG (X-ray Texture Goniometry) to collect fabric measurements on phyllosilicate-bearing rock samples.

Features

Standard sealed tube X-ray generator (Cu @ 2.4 kW)
Kappa goniometer head
NaI scintillator/ PMT detector
Modified stage for transmission XRD

The Enraf Nonius CAD4 Single Crystal X-Ray Diffractometer

HREM Twin

Si Map on Semiconductor Chip

Nanobamas

O Map on Semiconductor Chip

Soot particles on a holey caron film

Al Map on Semiconductor Chip

HREM Twin

Enraf Nonius CAD4 Single Crystal X-Ray Diffractometer