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HREM image of grains of silicon nitride

Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.

Image by Pan Group

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HREM image of grains of silicon nitride

Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.

Image by Pan Group

Enraf Nonius CAD4 Single Crystal X-Ray Diffractometer

Location: 2501B C. C. Little Building
Contact: Anja Schleicher
Acknowledgments: Funding for this instrument came from a variety of sources, publication acknowledgements should refer to the support of the University of Michigan Electron Microbeam Analysis Laboratory

Enraf Nonius CAD4 Single Crystal X-Ray Diffractometer: The CAD4 is a single crystal X-ray diffractometer which has been modified for XTG (X-ray Texture Goniometry) to collect fabric measurements on phyllosilicate-bearing rock samples.

Features

CAD4 XRD The Enraf Nonius CAD4 Single Crystal X-Ray Diffractometer