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InAs Islands on FIB-Templated InP

InAs islands grown by molecular beam epitaxy on an InP substrate patterned by FIB milling.   SE image recorded on FEI Nova Nanolab at 5 kV.

Image by Kevin Grossklaus, Prof. Mirecki-Millunchick's Research Group

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InAs Islands on FIB-Templated InP

InAs islands grown by molecular beam epitaxy on an InP substrate patterned by FIB milling.   SE image recorded on FEI Nova Nanolab at 5 kV.

Image by Kevin Grossklaus, Prof. Mirecki-Millunchick's Research Group

Cameca CAMEBAX Electron Microprobe Analyzer 4 Spectrometers

Location: 2501B C. C. Little Building
Contact: Gordon Moore

Electron Microprobe Analyzer: This instrument is designed for quantitative microanalysis using both wavelength and energy dipersive X-ray spectrometry. Samples may be imaged by light optics (transmitted and reflected light) or electron optics (secondary and backscattered electrons and sample current mode) to determine the desired locations for analysis.

Applications

Accelerating Voltages

Filament

Vacuum

SEM Resolution

WDS System

Stage Control

XEDS System

Additional Features

Cameca Camebax EPMA David Borrok, a graduate student in Geological Sciences operating the Cameca CAMEBAX Electron Microprobe Analyzer