Play
Close
dislocs.jpg

Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

Caption Arrow

Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

The Hitachi S3200N Scanning Electron Microscope

Location: 2501B C. C. Little Building
Contact: Gordon Moore

Scanning Electron Microscopy: The Hitachi S3200N Scanning Electron Microscope is one of a new series of Variable Pressure Scanning Electron Microscopes (VPSEM). The VPSEM is a conventional high resolution thermionic SEM which allows the operator to control the specimen chamber vacuum level and environment. A specimen maybe inserted directly into the VPSEM and observed in it's natural state.

Applications

Accelerating Voltages

Filament

Vacuum

Detectors

Magnification

SEM Resolution

Hitachi S3200 SEM Denette Murphy, a graduate student in Biology, operating the Hitachi S3200N SEM.