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Bend contours in a Ni-8Al-4Ge alloy

Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.

Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.

Title: Description:
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Bend contours in a Ni-8Al-4Ge alloy

Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.

Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.

Title: Description:

The Hitachi S3200N Scanning Electron Microscope

Location: 2501B C. C. Little Building
Contact: Gordon Moore

Scanning Electron Microscopy: The Hitachi S3200N Scanning Electron Microscope is one of a new series of Variable Pressure Scanning Electron Microscopes (VPSEM). The VPSEM is a conventional high resolution thermionic SEM which allows the operator to control the specimen chamber vacuum level and environment. A specimen maybe inserted directly into the VPSEM and observed in it's natural state.

Applications

Accelerating Voltages

Filament

Vacuum

Detectors

Magnification

SEM Resolution

Hitachi S3200 SEM Denette Murphy, a graduate student in Biology, operating the Hitachi S3200N SEM.