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DBaFe2As2.jpg

Superlattice of SrTiO and BaFe2As2

Digitally enhanced HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.
Image by Shuyi Zhang from the Pan Research Group.

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Superlattice of SrTiO and BaFe2As2

Digitally enhanced HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.
Image by Shuyi Zhang from the Pan Research Group.

Philips CM12 AEM

Location: 2501B C. C. Little Building
Contact: Gordon Moore or Anja Schleicher
Acknowledgments: Publications resulting from work on this instrument should acknowledge the support of NSF grant #EAR-8708276

Analytical Electron Microscopy: Analytical Electron Microscopy is a generic term that is applied to any study where a variety of analysis techniques are used within one particular microscope. These techniques typically include X-ray Energy Dispersive Spectroscopy (XEDS), Electron Energy Loss Spectroscopy (EELS), Selected Area Electron Diffraction (SAED), Convergent Beam Electron Diffration (CBED), Scanning Transmission Electron Microscopy, and Scanning Electron Microscopy. These techniques are briefly described in the glossary.

The University of Michigan EMAL has three analytical microscopes. They range in complexity form a fully commissioned instrument equipped for all of the above techniques to a basic CBED analysis instrument.

Applications

Accelerating Voltages

Filament

Vacuum

Resolution

Detectors

Sample Holders

Philips CM12 AEM Lishun Kao, a postgraduate student in Geological Sciences optimizing a STEM image on the Philips CM12.