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Si Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield

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Si Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield

Scintag X1 Powder X-Ray Diffractometer

Location: 2501B C. C. Little Building
Contact: Jerry Li

Scintag X1 Powder X-Ray Diffractometer: The Scintag X1 PXRD is a general purpose X-ray diffractometer suited for routine characterization of minerals, ceramics, pharameuticals and other powdered materials.

Features

Methods

Scintag XRD The Scintag X-1 Powder X-ray Diffractometer