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Dislocations in a strained InGaAs film

Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.

Image by Kevin Grossklaus, Millunchick Research Group

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Dislocations in a strained InGaAs film

Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.

Image by Kevin Grossklaus, Millunchick Research Group

Scintag X1 Powder X-Ray Diffractometer

Location: 2501B C. C. Little Building
Contact: Jerry Li

Scintag X1 Powder X-Ray Diffractometer: The Scintag X1 PXRD is a general purpose X-ray diffractometer suited for routine characterization of minerals, ceramics, pharameuticals and other powdered materials.

Features

Methods

Scintag XRD The Scintag X-1 Powder X-ray Diffractometer