EMAL | Facilities & Instruments

Porous Si at High Magnification

SEM image of porous silicon.

Image by EMAL Staff

Au Particle Formed on Au/BaTiO3 film
Scanning electron microscope image, recorded in the Hitachi S3200N SEM, of a small gold particle formed after heat treatment of a series of thin films of LaSrTiO3/BaTiO3 grown on top of a SrTiO3 substrate via pulse-laser deposition.
Carbon Nanotubes Modified with an Ultrafast Laser
Low magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.

Image by John Mansfield
CBED of Metal Carbide
Convergent beam electron diffraction pattern of M23X6, a metal carbo-nitro-boride common in steels.

Pattern by John Mansfield
HREM Twin
Twin detail in alloy foil in HREM.
Carbon Nanotubes Modified with an Ultrafast Laser
High magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.

Image by John Mansfield

Porous Si at High Magnification

SEM image of porous silicon.

Image by EMAL Staff

Scintag X1 Powder X-Ray Diffractometer

Location: 2501B C. C. Little Building
Contact: Anja Schleicher

Scintag X1 Powder X-Ray Diffractometer: The Scintag X1 PXRD is a general purpose X-ray diffractometer suited for routine characterization of minerals, ceramics, pharameuticals and other powdered materials.

Features

Standard sealed tube X-ray generator for PXRD (Cu @ 1.2 kW)
Single sample stage
Si(Li) solid-state detector
Theta:Theta goniometer
DMS NT and Match software; PDF-2 X-ray database
Self-contained X-ray safety enclosure
Optional high-T stage (20 to 2000C)
Optional low-T stage (-190 to 300C)
Optional focusing mirror for grazing incidence

The Scintag X-1 Powder X-ray Diffractometer

Porous Si at High Magnification

Au Particle Formed on Au/BaTiO3 film

Carbon Nanotubes Modified with an Ultrafast Laser

CBED of Metal Carbide

HREM Twin

Carbon Nanotubes Modified with an Ultrafast Laser

Porous Si at High Magnification

Scintag X1 Powder X-Ray Diffractometer