Play
Close
PourousSi1.jpg

Porous Si at Low Magnification

SEM image of porous silicon.

Image by EMAL Staff

Caption Arrow

Porous Si at Low Magnification

SEM image of porous silicon.

Image by EMAL Staff

Rigaku Ultima IV X-Ray Diffractometer

Location: 2501B C. C. Little Building
Contact: Anja Schleicher

Rigaku Ultima IV X-Ray Diffractometer: The Rigaku Ultima IV XRD The Ultima IV is a te state of the art multipurpose X-ray diffraction (XRD) system. It uses Rigaku's cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries. The Ultima IV X-ray diffractometer can perform characterization of minerals, ceramics, pharameuticals and other powdered materials.

Features

Rigaku Ultima IV The Rigaku Ultima IV X-ray Diffractometer