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Ridged Morphology of Aluminum Oxide formed on Ni-Al-Cr-W superalloy

Surface oxide formed during oxidation of experimental W-rich Ni-base superalloys in simulated impure-He environment. SE image recorded on Philips XL30 FEG SEM at 20kV

Image by Raghav Adharapurapu, Prof. Pollock's Research Group

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Ridged Morphology of Aluminum Oxide formed on Ni-Al-Cr-W superalloy

Surface oxide formed during oxidation of experimental W-rich Ni-base superalloys in simulated impure-He environment. SE image recorded on Philips XL30 FEG SEM at 20kV

Image by Raghav Adharapurapu, Prof. Pollock's Research Group

Rigaku Ultima IV X-Ray Diffractometer

Location: 2501B C. C. Little Building
Contact: Jerry Li

Rigaku Ultima IV X-Ray Diffractometer: The Ultima IV is a state-of-the-art multipurpose X-ray diffraction (XRD) system. It uses Rigaku's cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries. The Ultima IV X-ray diffractometer can perform micro-crystalline diffraction, thin-film diffraction, small angle scattering, and in-plane scattering for minerals, ceramics, pharameuticals and other powdered materials.

X-ray generator

Goniometer

Detector

Accessories

Methods

Further Information

Rigaku Ultima IV The Rigaku Ultima IV X-ray Diffractometer