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Superlattice of SrTiO and BaFe2As2

Digitally enhanced HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.
Image by Shuyi Zhang from the Pan Research Group.

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Superlattice of SrTiO and BaFe2As2

Digitally enhanced HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.
Image by Shuyi Zhang from the Pan Research Group.

Rigaku Ultima IV X-Ray Diffractometer

Location: 2501B C. C. Little Building
Contact: Anja Schleicher

Rigaku Ultima IV X-Ray Diffractometer: The Rigaku Ultima IV XRD The Ultima IV is a te state of the art multipurpose X-ray diffraction (XRD) system. It uses Rigaku's cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries. The Ultima IV X-ray diffractometer can perform characterization of minerals, ceramics, pharameuticals and other powdered materials.

Features

Rigaku Ultima IV The Rigaku Ultima IV X-ray Diffractometer