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Al Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield.

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Al Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield.

Rigaku Ultima IV X-Ray Diffractometer

Location: 2501B C. C. Little Building
Contact: Jerry Li

Rigaku Ultima IV X-Ray Diffractometer: The Ultima IV is a state-of-the-art multipurpose X-ray diffraction (XRD) system. It uses Rigaku's cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries. The Ultima IV X-ray diffractometer can perform micro-crystalline diffraction, thin-film diffraction, small angle scattering, and in-plane scattering for minerals, ceramics, pharameuticals and other powdered materials.

X-ray generator

Goniometer

Detector

Accessories

Methods

Further Information

Rigaku Ultima IV The Rigaku Ultima IV X-ray Diffractometer