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Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

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Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

North Campus

Space Research Building

H.H. Dow Building

EMAL now manages the Materials Science and Engineering X-ray diffractometer systems and this subset of instruments comprise the Hanawalt X-ray Laboratory, named in honor of Donald Hanawalt. The laboratory is also known as XMAL.