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HAADF STEM Image of Copper Aluminum Precipitates

A high angle annular dark field scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.

Image by FEI

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HAADF STEM Image of Copper Aluminum Precipitates

A high angle annular dark field scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.

Image by FEI

North Campus

North Campus Research Complex (NCRC)

H.H. Dow Building

EMAL now manages the Materials Science and Engineering X-ray diffractometer systems and this subset of instruments comprise the Hanawalt X-ray Laboratory, named in honor of Donald Hanawalt. The laboratory is also known as XMAL.