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Dislocations in a strained InGaAs film

Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.

Image by Kevin Grossklaus, Millunchick Research Group

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Dislocations in a strained InGaAs film

Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.

Image by Kevin Grossklaus, Millunchick Research Group

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North Campus Research Complex (NCRC)

Space Research Building (SRB)

H.H. Dow Building

EMAL now manages the Materials Science and Engineering X-ray diffractometer systems and this subset of instruments comprise the Hanawalt X-ray Laboratory, named in honor of Donald Hanawalt. The laboratory is also known as XMAL.