EMAL | Facilities & Instruments

Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

Metal coated CNT bundles
High magnification of metal coated carbon nanotube bundles prepared by sputter deposition. SE image on Nova Nanolab taken at 10 kV.

Image taken by Anne Juggernauth
ZnO crystals grown on Carbon Nanotubes
ZnO "barbed wire" crystals grown on carbon nanotubes.

Image by John Hart Group
Carbon Nanotubes Modified with an Ultrafast Laser
High magnification SEM image of a carbon nanotube mat modified by shots from a femtosecond laser. Accelerating voltage 2kV.

Image by John Mansfield
SADP
Selected area diffraction pattern of alloy phase with strong structure factor intensity variation in the 00X spots.

Image by John Mansfield
CBED of Metal Carbide
Convergent beam electron diffraction pattern of M23X6, a metal carbo-nitro-boride common in steels.

Pattern by John Mansfield

Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

North Campus

Space Research Building

H.H. Dow Building

EMAL now manages the Materials Science and Engineering X-ray diffractometer systems and this subset of instruments comprise the Hanawalt X-ray Laboratory, named in honor of Donald Hanawalt. The laboratory is also known as XMAL.

Dislocations in Si-Ge Thin Film

Metal coated CNT bundles

ZnO crystals grown on Carbon Nanotubes

Carbon Nanotubes Modified with an Ultrafast Laser

SADP

CBED of Metal Carbide

Dislocations in Si-Ge Thin Film

North Campus