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Si Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield

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Si Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield

Cameca LEAP 4000X HR Atom Probe Instrument

Location: 415 Space Research Building
Phone: +1-734-936-3350.
Contact: John Mansfield or Emmanuelle Marquis
Instructions:
Acknowledgments: Publications resulting from work on this instrument should acknowledge the support of the University of Michigan College of Engineering

Aton Probe Tomography: For further information on this technique see Cameca's website and EMAL's techniques glossary.

Applications

Vacuum

Voltage Mode

Laser Mode

About the Technique

Cameca LEAP HR
Cameca LEAP HR The EMAL Cameca LEAP Atom Probe 4000X HR installed in the North Campus EMAL.