Bruker D8 Discover X-ray Diffractometer with a General Area Detector Diffraction System (GADDS)
Location: Room 2219 H.H. DowBuilding
Contact: Ying Qi
Instructions: Bruker Discover D8 SOP
Acknowledgments:Publications resulting from work on this instrument should acknowledge
Bruker D8 Discover X-ray Diffractometer with a General Area Detector Diffraction System (GADDS): This system is available in a variety of configurations to fulfill requirement of different applications and samples. It’s flexible with samples size and sample amounts, inhomogeneous or oriented sample of complex shape geometry. With 2-D HighStar detector it needs very short measuring time. Typical applications include microdiffraction, phase ID, stress analysis and X-Y mapping.
Features
- Siemens Kristalloflex 760 X-Ray Generator
- Spot focus sealed Cu Kα Radiation X-ray tube with Peak power of 2.2 kW
- Göbel mirror Monochromator
- Pinhole Collimator/Monocapillary
- Motorized X/Y/Z sample stage
- Laser-Video sample alignment system
- Two circle goniometer
- Hi Star Area Detector
Professor Yalisove and Teaching Assistant Jiaoshi Miao, of the Department of Materials Science and Engineering, are demonstrating and comparing polycrystalline sample diffraction and single crystal sample diffraction on D8 discover XRD for a class of MSE465 Students.