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Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

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Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

Bruker NanoStar Small-Angle X-ray Scattering (SAXS) System

Location: Room 2219 H.H. Dow Building
Contact: Ying Qi
Instructions: Bruker Nanostar SOP
Acknowledgments:Publications resulting from work on this instrument should acknowledge

Bruker NanoStar Small-Angle X-ray Scattering (SAXS) System: This Bruker NanoStar System yields information such as particle sizes and distributions from 1 to 100 nm, shape and orientation distributions in liquid, powders and bulk samples. Additionally, a real space images with 100 µm resolution of the sample can be recorded.

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Bruker Nanostar SAXS Charles Shaw, a graduate student from the Macromolecular Science & Engineering program, operating the Bruker Nanostar.