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Bend contours in a Ni-8Al-4Ge alloy

Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.

Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.

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Bend contours in a Ni-8Al-4Ge alloy

Bright-field TEM image of bend contours converging at a 110 zone axis, observed in a polycrystalline Ni-Al8-Ge4 alloy sample. TEM image recorded on the JEOL 2010F AEM.

Image by Kevin Grossklaus, Millunchick Research Group. Sample provided by John Mansfield.

Title: Description:

Bruker NanoStar Small-Angle X-ray Scattering (SAXS) System

Location: Room 2219 H.H. Dow Building
Contact: Ying Qi
Instructions: Bruker Nanostar SOP
Acknowledgments:Publications resulting from work on this instrument should acknowledge

Bruker NanoStar Small-Angle X-ray Scattering (SAXS) System: This Bruker NanoStar System yields information such as particle sizes and distributions from 1 to 100 nm, shape and orientation distributions in liquid, powders and bulk samples. Additionally, a real space images with 100 µm resolution of the sample can be recorded.

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Bruker Nanostar SAXS Charles Shaw, a graduate student from the Macromolecular Science & Engineering program, operating the Bruker Nanostar.