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Si CBED

Silicon <111> convergent beam electron diffraction pattern, bright field disc showing 3m symmetry.

Pattern by John Mansfield

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Si CBED

Silicon <111> convergent beam electron diffraction pattern, bright field disc showing 3m symmetry.

Pattern by John Mansfield

FEI Nova Nanolab Dualbeam Focussed Ion Beam Workstation and Scanning Electron Microscope

Location: 426 Space Research Building
Contact: John Mansfield or Kai Sun
Instructions: Nova NanoLab Online Documentation
Acknowledgments: Publications resulting from work on this instrument should acknowledge the support of NSF grant #DMR-0320740

Applications

Accelerating Voltage

Electron Filament

Vacuum

Detectors

SEM Resolution

Ion Resolution

XEDS System

Gas Injectors

Micromanipulator (plucker)

Included Software

Specimen Preparation Papers of Interest to Users

FEI Nova NanoLab Dr. Sha Zhu, a Post-Doctoral Research Fellow in Nuclear Engineering and Radiological Sciences, sectionning a sample with the Nova NanoLab Dualbeam FIB.