Veeco Dimension Icon Atomic Force Microscope
Location: Room G022, Building 22 of The North Campus Research Complex
Phone: +1-(734) 764-2939.
Contact: John Mansfield, Kai Sun, or Haiping Sun
Instructions: Dimension Icon Manual (500+ pages)
Webcam: Dimension Icon Webcam
Acknowledgments: Funding for the Veeco Dminesion Icon AFM came from a variety of csources. Erdogan Gulari of the COE, Marvin Parnes and Mark Banaszak Holl of the OVPR, Michael Solomon of Chemical Engineering, Brad Orr and Roy Clarke of Physics, Peter Green, Joanna Mirecki Millunchick and Xiaoqing Pan of Materials Science and Engineering, Ann Marie Sastry and Michael Thouless of Mechanical Engineering and the EMAL discretionary account all provided financial support of this new instrument.
Atomic Force/Scanning Probe Microscopy: Atomic force microscopy (AFM), scanning force microscopy (SFM) is a high-resolution microscopic technique where the microscopic information is gathered by "feeling" the surface with a mechanical probe. Piezoelectric scanners facilitate (in x,y and z directions) tiny, but accurate, movements to enable very precise scanning. With demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit, AFM has become a standard technique for surface analysis of materials. The precursor to the AFM, the scanning tunneling microscope, was developed by Gerd Binnig and Heinrich Rohrer in the early 1980s at IBM Research - Zurich, a development that earned them the Nobel Prize for Physics in 1986. Binnig, Quate and Gerber invented the first atomic force microscope in 1986. The first commercially available atomic force microscope was introduced in 1989.
ApplicationsSome of these applications may require the purchase of special cantilevers, cantilever holders, etc.
- Contact AFM
- Tapping AFM
- Lateral Force AFM
- STM (needs a tip holder)
- Magnetic Force Microscopy
- Veeco's ScanAsyst / PeakForce Tapping
- Fluid Imaging
- Veeco's QNM (nanomechanical mapping)
- Surface Potential / Scanning Kelvin Probe Microscopy
- Phase Imaging
- LiftMode (enables MFM/EFM)
- Force curve and pulling
- Torsional Resonance Mode
- Piezo Response
- 90µm by 90µm
- Heavily sample and technique dependent
- High Efficiency Direct Drive Tapping Mode Cantilever Holder for Scanning in Fluid
- Vibration isolation system and environmental enclosure for high-resolution imaging
- Digital image acquisition of optical microscope images
- The sample vacuum platen can take up to 200mm diameter samples.
- The maximum Z scanning hieght is of the order of 5µm.
- The maximum height of a sample is of the order of 12mm.