JEOL 2010F Analytical Electron Microscope
Location: 431 Space Research Building
Contact: John Mansfield or Kai Sun
Instructions: JEOL 2010F AEM PDF Handbook
Acknowledgments: Publications resulting from work on this instrument should acknowledge the support of NSF grant #DMR-9871177
Analytical Electron Microscopy: Analytical Electron Microscopy is a generic term that is applied to any study where a variety of analysis techniques are used within one particular microscope. These techniques typically include X-ray Energy Dispersive Spectroscopy (XEDS), Electron Energy Loss Spectroscopy (EELS), Selected Area Electron Diffraction (SAED), Convergent Beam Electron Diffraction (CBED), Scanning Transmission Electron Microscopy, and Scanning Electron Microscopy. These techniques are briefly described in the glossary.
- XEDS, Parallel EELS, Imaging Filter, SAED, CBED, STEM, HAADF STEM, HREM, Diffraction Contrast Imaging
- 0 to 200 kV (50 V steps)
- Zirconated Tungsten (100) thermal field emission tipn
- ~1.5 x10^-7 torr
- CTEM 0.10 nm lattice / 0.25 nm point-to-point
- STEM 0.17 nm HAADF (high angle annular dark field)
- Horizontal Ultra-thin Window Si-Li X-ray detector (active area = 30 mm^2) capable of detecting elements with Z >5.
- EDAX r-TEM Detector with EDAX acquisition software
- Gatan Imaging Filter (GIF) for electron energy loss spectroscopy and imaging.
Image Acquisition & Analysis System
- Gatan #794 cooled multi-scan CCD TV camera for high resolution imaging (above the GIF)
- Gatan #692 Retractable TV rate CCD TV camera.
- JEOL Single-Tilt Stage
- JEOL Double-Tilt Analytical Stage
- Gatan #646 Double-Tilt (x=±35 degrees, y=±35 degrees) Low Background (Be) Stage with Faraday cup.
- Gatan #636 Double-Tilt (x=±35 degrees, y=±35 degrees) Low Background (Be) Liquid-Nitrogen Stage.
- Gatan #652 Double-Tilt Heating Holder with a maximum operating temperature of 1000 degrees Celsius.
- Free lens control, fully independent control of all lenses.
- FasTEM remote NT server based control system.