JEOL 2010F Analytical Electron Microscope

Location: Room G020, Building 22 of The North Campus Research Complex
Phone: +1-(734) 764-5625
Webcam: JEOL 2010F Webcam
Contact: John Mansfield or Kai Sun
Instructions: JEOL 2010F AEM PDF Handbook
Acknowledgments: Publications resulting from work on this instrument should acknowledge the support of NSF grant #DMR-9871177

Analytical Electron Microscopy: Analytical Electron Microscopy is a generic term that is applied to any study where a variety of analysis techniques are used within one particular microscope. These techniques typically include X-ray Energy Dispersive Spectroscopy (XEDS), Electron Energy Loss Spectroscopy (EELS), Selected Area Electron Diffraction (SAED), Convergent Beam Electron Diffraction (CBED), Scanning Transmission Electron Microscopy, and Scanning Electron Microscopy. These techniques are briefly described in the glossary.


Accelerating Voltage




XEDS System

EELS System

Image Acquisition & Analysis System

Sample Holders

Other Accesories


JEOL 2010F AEM Fang Cao, a graduate student in Professor Tresa Pollock's group in the Department of Materials Science and Engineering operating the JEOL 2010F. Light painting by Aaron Kiley.