Play
Close
GoldSphere.jpg

Au Particle Formed on Au/BaTiO3 film

Scanning electron microscope image, recorded in the Hitachi S3200N SEM, of a small gold particle formed after heat treatment of a series of thin films of LaSrTiO3/BaTiO3 grown on top of a SrTiO3 substrate via pulse-laser deposition.

Caption Arrow

Au Particle Formed on Au/BaTiO3 film

Scanning electron microscope image, recorded in the Hitachi S3200N SEM, of a small gold particle formed after heat treatment of a series of thin films of LaSrTiO3/BaTiO3 grown on top of a SrTiO3 substrate via pulse-laser deposition.

JEOL 2010F Analytical Electron Microscope

Location: 431 Space Research Building
Contact: John Mansfield or Kai Sun
Instructions: JEOL 2010F AEM PDF Handbook
Acknowledgments: Publications resulting from work on this instrument should acknowledge the support of NSF grant #DMR-9871177

Analytical Electron Microscopy: Analytical Electron Microscopy is a generic term that is applied to any study where a variety of analysis techniques are used within one particular microscope. These techniques typically include X-ray Energy Dispersive Spectroscopy (XEDS), Electron Energy Loss Spectroscopy (EELS), Selected Area Electron Diffraction (SAED), Convergent Beam Electron Diffraction (CBED), Scanning Transmission Electron Microscopy, and Scanning Electron Microscopy. These techniques are briefly described in the glossary.

Applications

Accelerating Voltage

Filament

Vacuum

Resolution

XEDS System

EELS System

Image Acquisition & Analysis System

Sample Holders

Other Accesories

Techniques

JEOL 2010F AEM Fang Cao, a graduate student in Professor Tresa Pollock's group in the Department of Materials Science and Engineering operating the JEOL 2010F. Light painting by Aaron Kiley.