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Dislocations in a strained InGaAs film

Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.

Image by Kevin Grossklaus, Millunchick Research Group

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Dislocations in a strained InGaAs film

Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.

Image by Kevin Grossklaus, Millunchick Research Group

JEOL 3100R05 Double Cs-Corrected Analytical Electron Microscope

Location: Room G032, Building 22 of The North Campus Research Complex
Phone: +1-(734) 764-2938
       Contact: John Mansfield or Kai Sun
Instructions: This instrument is operated as a high resolution STEM only. If you require high resolution TEM you should use the JEOL 3011. The JEOL instruction manual for this instrument has useful sections and illustrates the layout of the controls. However, it is included here for reference only, indeed, there are a number of service functions listed in the manual are NOT to be performed by users. As with all EMAL instruments, users should be instructed on instrument use by EMAL staff. The most useful document for users of this instrument is the CsCorrector User Manual
. New users should download this document and study it prior to a staff training session on the instrument. Acknowledgments: Publications resulting from work on this instrument should acknowledge the support of NSF grant #DMR-0723032

Analytical Electron Microscopy: Analytical Electron Microscopy is a generic term that is applied to any study where a variety of analysis techniques are used within one particular microscope. These techniques typically include X-ray Energy Dispersive Spectroscopy (XEDS), Electron Energy Loss Spectroscopy (EELS), Selected Area Electron Diffraction (SAED), Convergent Beam Electron Diffraction (CBED), Scanning Transmission Electron Microscopy, and Scanning Electron Microscopy. These techniques are briefly described in the glossary.

Applications

Accelerating Voltage

Filament

Vacuum

Resolution

XEDS System

EELS System

Image Acquisition & Analysis System

Sample Holders

Other Accesories

Techniques

JEOL 2100F AEM The EMAL 2100F Cs Corrected AEM in room 432 EMAL.