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Metal coated CNT bundles

High magnification of metal coated carbon nanotube bundles prepared by sputter deposition. SE image on Nova Nanolab taken at 10 kV.

Image taken by Anne Juggernauth

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Metal coated CNT bundles

High magnification of metal coated carbon nanotube bundles prepared by sputter deposition. SE image on Nova Nanolab taken at 10 kV.

Image taken by Anne Juggernauth

JEOL 3011 High Resolution Electron Microscope

Location: 429 Space Research Building
Contact: John Mansfield or Kai Sun
Instructions: JEOL 3011 PDF Handbook
Acknowledgments: Publications resulting from work on this instrument should acknowledge the support of NSF grant #DMR-0315633

High Resolution Electron Microscopy: High Resolution Electron Microscopy is phase contrast microscopy of the atomic structure of materials. Specimen stages in these instruments are typically in the high-stability, top-entry configuration. An image intensified TV system allows the observation of the structure images on a TV screen prior to the recording of micrographs. Dynamic experiments are usually recorded onto video tape. A computer controlled image acquisition and analysis package is invaluable for the capture and storage of images of both on-line and off-line analysis and comparison with images calculated with multislice algorithims.

Applications

Accelerating Voltage

High Voltage Stability

Vacuum

Imaging Specifications

Specimen Stage

TV & Digital Image Aquisition System

X-ray Energy Dispersive Spectrometry System

Manuals

The following are manuals for the AMT Imaging Software V5.4.

JEOL 3011 HREM Patricia Savage, a UROP student from the Department of Materials Science & Engineering operating the JEOL 3011. Light painting by Aaron Kiley.