Porous Si at Low Magnification

SEM image of porous silicon.

Image by EMAL Staff

Caption Arrow

Porous Si at Low Magnification

SEM image of porous silicon.

Image by EMAL Staff

JEOL 3011 High Resolution Electron Microscope

Location: Room G024, Building 22 of The North Campus Research Complex
Phone: +1-(734) 764-5625
Contact: John Mansfield or Kai Sun
Instructions: JEOL 3011 PDF Handbook
Webcam: JEOL 3011 Webcam
Acknowledgments: Publications resulting from work on this instrument should acknowledge the support of NSF grant #DMR-0315633

High Resolution Electron Microscopy: High Resolution Electron Microscopy is phase contrast microscopy of the atomic structure of materials. Specimen stages in these instruments are typically in the high-stability, top-entry configuration. An image intensified TV system allows the observation of the structure images on a TV screen prior to the recording of micrographs. Dynamic experiments are usually recorded onto video tape. A computer controlled image acquisition and analysis package is invaluable for the capture and storage of images of both on-line and off-line analysis and comparison with images calculated with multislice algorithims.


Accelerating Voltage

High Voltage Stability


Imaging Specifications

Specimen Stage

TV & Digital Image Aquisition System

X-ray Energy Dispersive Spectrometry System


The following are manuals for the AMT Imaging Software V5.4.

JEOL 3011 HREM Patricia Savage, a UROP student from the Department of Materials Science & Engineering operating the JEOL 3011. Light painting by Aaron Kiley.