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DBaFe2As2.jpg

Superlattice of SrTiO and BaFe2As2

Digitally enhanced HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.
Image by Shuyi Zhang from the Pan Research Group.

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Superlattice of SrTiO and BaFe2As2

Digitally enhanced HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.
Image by Shuyi Zhang from the Pan Research Group.

JEOL 3011 High Resolution Electron Microscope

Location: 429 Space Research Building
Contact: John Mansfield or Kai Sun
Instructions: JEOL 3011 PDF Handbook
Acknowledgments: Publications resulting from work on this instrument should acknowledge the support of NSF grant #DMR-0315633

High Resolution Electron Microscopy: High Resolution Electron Microscopy is phase contrast microscopy of the atomic structure of materials. Specimen stages in these instruments are typically in the high-stability, top-entry configuration. An image intensified TV system allows the observation of the structure images on a TV screen prior to the recording of micrographs. Dynamic experiments are usually recorded onto video tape. A computer controlled image acquisition and analysis package is invaluable for the capture and storage of images of both on-line and off-line analysis and comparison with images calculated with multislice algorithims.

Applications

Accelerating Voltage

High Voltage Stability

Vacuum

Imaging Specifications

Specimen Stage

TV & Digital Image Aquisition System

X-ray Energy Dispersive Spectrometry System

Manuals

The following are manuals for the AMT Imaging Software V5.4.

JEOL 3011 HREM Patricia Savage, a UROP student from the Department of Materials Science & Engineering operating the JEOL 3011. Light painting by Aaron Kiley.