JEOL 3011 High Resolution Electron Microscope
Location: 429 Space Research Building
Contact: John Mansfield or Kai Sun
Instructions: JEOL 3011 PDF Handbook
Acknowledgments: Publications resulting from work on this instrument should acknowledge the support of NSF grant #DMR-0315633
High Resolution Electron Microscopy: High Resolution Electron Microscopy is phase contrast microscopy of the atomic structure of materials. Specimen stages in these instruments are typically in the high-stability, top-entry configuration. An image intensified TV system allows the observation of the structure images on a TV screen prior to the recording of micrographs. Dynamic experiments are usually recorded onto video tape. A computer controlled image acquisition and analysis package is invaluable for the capture and storage of images of both on-line and off-line analysis and comparison with images calculated with multislice algorithims.
- 100 to 000 kV (100 V steps)
High Voltage Stability
- ~1.5x10^-7 torr (Gun Area)
- ~1.5x10^-7 torr (Specimen Area)
- Objective Current Stability: 1ppm/minute
- Objective Focal Length: 2.5 mm
- Spherical Aberration Coef. (Cs): 0.6 mm
- Chromatic Aberration Coef. (Cc): 1.3 mm
- Minimum Focus Step: 1 nm
- Point-to-Point Resolution: 0.17 nm
- Lattice Resolution: 0.14 nm
- Specimen Tilt: ±30 degrees
- Specimen Diameter: 3.0 mm
TV & Digital Image Aquisition System
- Advanced Microscopy Techniques ERB 1280 by 1024 Slow Scan CCD TV system.
- Slow scan system acquires digital images with AMT Imaging 5.4 on a Windows XP computer.
X-ray Energy Dispersive Spectrometry System
- EDAX r-TEM XEDS detector and software.
- Acquisition software runs on the same Windows XP computer as the CCD TV System.
ManualsThe following are manuals for the AMT Imaging Software V5.4.