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Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

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Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

Kratos Axis Ultra XPS

Location: 426 Space Research Building
Contact: John Mansfield, Kai Sun, or Haiping Sun
Instructions: EMAL Axis Ultra XPS PDF Handbook and Axis Ultra XPS PDF Manual from Kratos
Acknowledgments: Publications resulting from work on this instrument should acknowledge the support of NSF grant #DMR-0420785.

X-ray Photoelectron Spectroscopy: X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA), uses soft X-rays to produce photoelectrons from the surface layers of atoms in a solid sample. The emitted electrons are analyzed according to their kinetic energy and the spectrum so produced is used to identify the elements present and their chemical states.

Applications

X-ray Sources

Operating Conditions

Vacuum System

Specimen Stage

Analysis Area

Detector System

Computer System

Accessories

Sample Requirements

References

Flash Animations

Kratos Axis Ultra XPS Lindsay Shuller, a graduate student in the Department of Geological Sciences, positioning her sample in the Kratos Analytical Axis Ultra X-ray photoelectron spectrometer. Lindsay is assisted by C.V. Ramana, a potdoctoral fellow from Geological Sciences and Sara Worsham, an undergraduate student in the College of Literature Sciences and the Arts.