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Surface Carbides on Refractory-rich Ni-base superalloys

Surface carbides formed during carburization of experimental W- and Re-rich Ni-base superalloys. BSE image recorded on Philips XL30 FEGSEM at 20kV.

Image by Raghav Adharapurapu, Prof. Pollock's Research Group

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Surface Carbides on Refractory-rich Ni-base superalloys

Surface carbides formed during carburization of experimental W- and Re-rich Ni-base superalloys. BSE image recorded on Philips XL30 FEGSEM at 20kV.

Image by Raghav Adharapurapu, Prof. Pollock's Research Group

Philips XL30ESEM

Location: 422 Space Research Building
Contact: John Mansfield or Kai Sun
Instructions: Philips XL30ESEM PDF Handbook
Acknowledgments: Generously donated by Pfizer Inc.

Scanning Electron Microscopy: The Philips XL30 Environmental Scanning Electron Microscope (SEM) is one of a generation of SEMs that is completely controlled from a computer workstation. The XL series instruments are controlled by a personal computer running Microsoft Windows NT. This EMAL instrument employs a tungsten filament and is capable of functioning in both high vacuum mode and ESEM mode . This makes the instrument ideal for both imaging and microanalysis of a wide range of both electrically conducting and insulating materials.

Applications

Accelerating Voltage

Filament

Vacuum

Dectectors

Magnification

SEM Resolution

Sample Requirements

SEM Class Lecture Notes

Flash Animations

Application Notes for ESEM

Philips X130ESEM Joanna Mirecki Millunchick, a professor in the Department of Materials Science and Engineering, operating the Philips XL30ESEM.