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SADP

Selected area diffraction pattern of alloy phase with strong structure factor intensity variation in the 00X spots.

Image by John Mansfield

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SADP

Selected area diffraction pattern of alloy phase with strong structure factor intensity variation in the 00X spots.

Image by John Mansfield

Philips XL30ESEM

Location: 422 Space Research Building
Contact: John Mansfield or Kai Sun
Instructions: Philips XL30ESEM PDF Handbook
Acknowledgments: Generously donated by Pfizer Inc.

Scanning Electron Microscopy: The Philips XL30 Environmental Scanning Electron Microscope (SEM) is one of a generation of SEMs that is completely controlled from a computer workstation. The XL series instruments are controlled by a personal computer running Microsoft Windows NT. This EMAL instrument employs a tungsten filament and is capable of functioning in both high vacuum mode and ESEM mode . This makes the instrument ideal for both imaging and microanalysis of a wide range of both electrically conducting and insulating materials.

Applications

Accelerating Voltage

Filament

Vacuum

Dectectors

Magnification

SEM Resolution

Sample Requirements

SEM Class Lecture Notes

Flash Animations

Application Notes for ESEM

Philips X130ESEM Joanna Mirecki Millunchick, a professor in the Department of Materials Science and Engineering, operating the Philips XL30ESEM.