Play
Close
dislocs.jpg

Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

Caption Arrow

Dislocations in Si-Ge Thin Film

TEM image of dislocations in a silicon and silicon-gremanium thin film system.

Image by John Mansfield

Rigaku Rotating Anode X-Ray Diffractometer

Location: Room 2219 H.H. Dow Building
Contact: Ying Qi
Instructions: Rigaku Rotating Anode X-Ray Diffractometer SOP
Acknowledgments:Publications resulting from work on this instrument should acknowledge

Rigaku Rotating Anode X-Ray Diffractometer: This instrument is ageneral powder diffractometer with Pole figure attachment. It is used in identification of compounds, quantification of compounds, measurement of crystal grain size and crystal distortions, measurement of crystallinity, measurement of lattice constant, as well as the measurement of texture.

Features

Rigaku XRD Dr. Manjola Mancka of Pacific Industrial Development Corporation(PIDC) using the Rigaku Rotating Anode XRD to indentify the phases in her sample.