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Si Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield

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Si Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield

Rigaku Rotating Anode X-Ray Diffractometer

Location: Room 2219 H.H. Dow Building
Contact: Ying Qi
Instructions: Rigaku Rotating Anode X-Ray Diffractometer SOP
Acknowledgments:Publications resulting from work on this instrument should acknowledge

Rigaku Rotating Anode X-Ray Diffractometer: This instrument is ageneral powder diffractometer with Pole figure attachment. It is used in identification of compounds, quantification of compounds, measurement of crystal grain size and crystal distortions, measurement of crystallinity, measurement of lattice constant, as well as the measurement of texture.

Features

Rigaku XRD Dr. Manjola Mancka of Pacific Industrial Development Corporation(PIDC) using the Rigaku Rotating Anode XRD to indentify the phases in her sample.