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Metal coated CNT forest

Medium magnification image of 500nm film of NiTi sputtered on carbon nanotube forest. SE image on Nova Nanolab taken at 10 kV.

Image taken by Anne Juggernauth

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Metal coated CNT forest

Medium magnification image of 500nm film of NiTi sputtered on carbon nanotube forest. SE image on Nova Nanolab taken at 10 kV.

Image taken by Anne Juggernauth

Rigaku Rotating Anode X-Ray Diffractometer

Location: Room 2219 H.H. Dow Building
Contact: Ying Qi
Instructions: Rigaku Rotating Anode X-Ray Diffractometer SOP
Acknowledgments:Publications resulting from work on this instrument should acknowledge

Rigaku Rotating Anode X-Ray Diffractometer: This instrument is ageneral powder diffractometer with Pole figure attachment. It is used in identification of compounds, quantification of compounds, measurement of crystal grain size and crystal distortions, measurement of crystallinity, measurement of lattice constant, as well as the measurement of texture.

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Rigaku XRD Dr. Manjola Mancka of Pacific Industrial Development Corporation(PIDC) using the Rigaku Rotating Anode XRD to indentify the phases in her sample.