SEM CdTe Nanotube Rosette
Scanning electron microscope image a cluster of nanotubes of cadmium telluride.
Image by John Mansfield
O Map on Semiconductor Chip
An X-ray energy dispersive spectormetry map recorded using the Oxygen K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield
Al Map on Semiconductor Chip
An X-ray energy dispersive spectormetry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.
Image by John Mansfield.
HREM image of grains of silicon nitride
Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.
Image by Pan Group
Dislocations in Si-Ge Thin Film
TEM image of dislocations in a silicon and silicon-gremanium thin film system.
Image by John Mansfield
Porous Si at Low Magnification
SEM image of porous silicon.
Image by EMAL Staff
SEM CdTe Nanotube Rosette
Scanning electron microscope image a cluster of nanotubes of cadmium telluride.
Image by John Mansfield
