A high angle annular dark field scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.Image by FEI
HAADF STEM image of a bright Pt particle in barium cerium oxide.Image by Shuyi Zhang from the Pan Research Group.
Surface oxide formed during oxidation of experimental W-rich Ni-base superalloys in simulated impure-He environment. SE image recorded on Philips XL30 FEG SEM at 20kVImage by Raghav Adharapurapu, Prof. Pollock's Research Group
TEM image of dislocations in a silicon and silicon-gremanium thin film system.Image by John Mansfield
SEM image of porous silicon.Image by EMAL Staff
An XEDS map of a semiconductor chip, green is the silicon K alpha line, yellow is the gols M alpha line and red the carbon K line.Image by John Mansfield
Room G022, Building 22 of The North Campus Research Complex
View of the Bruker Dimension Icon AFM in room 421 of the North Campus EMAL. The image is brought to you via an Axis 206 Network Camera.
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