Silicon <111> convergent beam electron diffraction pattern, bright field disc showing 3m symmetry.Pattern by John Mansfield
An X-ray energy dispersive spectrometry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.Image by John Mansfield
HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.Image by Shuyi Zhang from the Pan Research Group.
Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.Image by Kevin Grossklaus, Millunchick Research Group
Surface oxide formed during oxidation of experimental W-rich Ni-base superalloys in simulated impure-He environment. SE image recorded on Philips XL30 FEG SEM at 20kVImage by Raghav Adharapurapu, Prof. Pollock's Research Group
TEM image of soot particles on a holey carbon support film.Image by EMAL Staff
Room G022, Building 22 of The North Campus Research Complex
View of the Bruker Dimension Icon AFM in room 421 of the North Campus EMAL. The image is brought to you via an Axis 206 Network Camera.
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