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Al Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield.

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Al Map on Semiconductor Chip

An X-ray energy dispersive spectrometry map recorded using the aluminum K alpha line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.

Image by John Mansfield.

Bruker Dimension Icon AFM in the North Campus EMAL

Room G022, Building 22 of The North Campus Research Complex
Phone:+1-(734) 764-2939

View of the Bruker Dimension Icon AFM in room 421 of the North Campus EMAL. The image is brought to you via an Axis 206 Network Camera.