Twin detail in alloy foil in HREM.
Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.Image by Kevin Grossklaus, Millunchick Research Group
Selected area diffraction pattern of alloy phase with strong structure factor intensity variation in the 00X spots.Image by John Mansfield
Geological section of mulitples phases with various levles of Ca within them. Image recorded in Ca K Alpha line.Image by Bob Anderhalt
TEM image of dislocations in a silicon and silicon-gremanium thin film system.Image by John Mansfield
TEM image of soot particles on a holey carbon support film.Image by EMAL Staff
Room G022, Building 22 of The North Campus Research Complex
View of the Bruker Dimension Icon AFM in room 421 of the North Campus EMAL. The image is brought to you via an Axis 206 Network Camera.
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