Surface carbides formed during carburization of experimental W- and Re-rich Ni-base superalloys. BSE image recorded on Philips XL30 FEGSEM at 20kV.Image by Raghav Adharapurapu, Prof. Pollock's Research Group
TEM image of dislocations in a silicon and silicon-gremanium thin film system.Image by John Mansfield
SEM image of the structure of crystals of Fe2O3 grown by chemical vapor deposition. The largest cluster is ~2µm in diameter.Image by Michelle Przybylek from the Linic Research Group.
Geological section of mulitples phases with various levles of Ca within them. Image recorded in Ca K Alpha line.Image by Bob Anderhalt
Weak beam dark-field TEM image of threading dislocation in a strained InGaAs film grown on GaAs. TEM image recorded on the JEOL 3011 HREM.Image by Kevin Grossklaus, Millunchick Research Group
An X-ray energy dispersive spectrometry map recorded using the Oxygen K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.Image by John Mansfield
Room G022, Building 22 of The North Campus Research Complex
View of the Bruker Dimension Icon AFM in room 421 of the North Campus EMAL. The image is brought to you via an Axis 206 Network Camera.
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