Two grains of silicon nitride, one at an <0001> axis and the other at a nearby two beam condition. Interface is amorphous.Image by Pan Group
A scanning transmission electron micrograph recorded in a Dualbeam FIB of semi-coherent copper aluminum precipitates in an aluminum alloy.Image by FEI
Selected area diffraction pattern of alloy phase with strong structure factor intensity variation in the 00X spots.Image by John Mansfield
HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.Image by Shuyi Zhang from the Pan Research Group.
InAs islands grown by molecular beam epitaxy on an InP substrate patterned by FIB milling. SE image recorded on FEI Nova Nanolab at 5 kV.Image by Kevin Grossklaus, Prof. Mirecki-Millunchick's Research Group
Transmission electron microscope bright field (left) and dark field (right) image pair of a thin film of a gamma/gamma' nickel based superalloy.Image by EMAL Staff
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View of the Bruker Dimension Icon AFM in room 421 of the North Campus EMAL. The image is brought to you via an Axis 206 Network Camera.
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