HAADF STEM image of bilayers of 1 nm SrTiO and 13.3nm BaFe2As2.Image by Shuyi Zhang from the Pan Research Group.
SEM image of porous silicon.Image by EMAL Staff
Scanning electron microscope image a cluster of nanotubes of cadmium telluride.Image by John Mansfield
Surface carbides formed during carburization of experimental W- and Re-rich Ni-base superalloys. BSE image recorded on Philips XL30 FEGSEM at 20kV.Image by Raghav Adharapurapu, Prof. Pollock's Research Group
An X-ray energy dispersive spectrometry map recorded using the Silicon K line. Map recorded on the FEI Quanta Dualbeam with an EDAX Apollo 40 Silicon Drift Detector.Image by John Mansfield
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